struct
Defined at line 498 of file ../../src/graphics/display/drivers/intel-display/registers-ddi-phy-tiger-lake.h
Process variation reported by the procmon (process monitor).
The process monitor is a circuit that detects process skew (effects of
manufacturing variation) for the chip area that hosts the display engine.
The skew is characterized as slow, nominal, or fast.
Sources:
* "Synergies Between Delay Test and Post-silicon Speed Path Validation:
A Tutorial Introduction," 2021 IEEE European Test Symposium (ETS)
* "Use of Process monitors in Post silicon validation to reduce TTM,"
2017 IEEE 35th VLSI Test Symposium (VTS)
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